In the present study,a population of 236 RIL(F7 and F8 generation) derived from two elite Chinese wheat (Triticum aestivum L.) cultivars ‘Xiaoyan 81’ and ‘Xinong 1376’,were used in an experimental study in Yangling of Shaanxi Province,Zhumadian of Henan Province and Jinan of Shandong Province for two consecutive years.The genetic linkage map was constructed with 172 SSR markers and the additive QTLs for the flag leaf length,width and area in wheat were analyzed through the software QTL IciMapping V3.2 which is based on the inclusive composite interval mapping.The results showed that:(1)9 QTLs for flag leaf length were located on chromosomes 1A,4A,3B,5D and 7D,single QTL explaining 5.10%~16.44% of the phenotypic variances.10 QTLs were located on chromosomes 1A,3A,5A,7A,3B and 5D,detected for flag leaf width,single QTL explaining the phenotypic variations from 4.63%~14.24%.12 QTLs for flag leaf area were mapped on 1A,4A,3B,2D and 5D chromosomes,accounting for 4.25%~22.67% of the phenotypic variations.(2)QTLs for flag leaf length,width and area were different and the genetic contribution of the same QTL were also variant in different phenotypic traits.(3)Among the QTLs for the same trait in the same year in different locations and those in the different years in the same location,some were the same but the others were different.(4)Some QTLs for different traits were located at the same marker interval of a chromosome and they performed pleiotropy.The results suggested that 2 QTLs detected on chromosomes 1A and 5D controlled the flag leaf length,width and area in wheat together.Besides,the former was the main effect gene and the phenotypic variation of latter was significant so that they could be used in marker-assisted selection breeding and polymerization breeding.